The relative secondary emission intensity of the molecular ion Al2- sputtered from a pure aluminium target by ionic bombardment (primary ions: Ar+, 6.5 keV) is larger than that of Al-, whereas this is not the case for the positive ions Al2+ and Al+. An ab initio calculation (LCAO-STO-MO-SCF-CI) is carried out on the configurations 4 Sigma g- and 2 Pi u of Al2-, 2 Sigma g+ and 2 Pi u of Al2+ and 3 Sigma g- and 1 Sigma g+ of Al2 within first a minimal basis and then an extended one. After configuration interaction, it is found that the ground states of Al2-, Al2+ and Al2 are respectively 4 Sigma g- (Re=5.0 Bohr, De-=2.42 eV), 2 Sigma g+ (Re=6.50 Bohr, De+=1.24 eV) and 3 Sigma g- (Re=4.85 Bohr, De0=1.03 eV; experimental ground state of Al2: 3 Sigma g-, Re=4.85 Bohr, 1.2<or approximately=D0<or approximately=2 eV). The binding energy of Al2- (4 Sigma g-), clearly larger than that of Al2+ (2 Sigma g+, allows us to explain the special experimental result given by secondary ionic emission with a stability of Al2- stronger that than of Al2+.