A low resolution survey comparison of the population distribution of the CH A2 Delta -X2 Pi system formed by the dissociative excitation of acetylene, acetone and butane by the impact of 21 keV Kr+ and of butane by 43 keV Ne+ ion bombardment is reported. Little sensitivity of the rotational level population distribution to the target molecule from which the radical was ejected, or to the environment or the latter-whether gas phase, or adsorbate layer on a silicon substrate, or solid (frozen)-was observed. Apparent non-equilibrium of the rotational level distribution in the (0,0) band for 21 keV Kr+ ion induced dissociation contrasts with the equilibrium-like distribution for 43 keV Ne+ bombardment, despite only a factor of three increase in projectile velocity. A particular sensitivity of the rotational level excitation mechanism to the electronic structure of the projectile is suggested, rather than to the collision time, or molecule, or molecular environment from which the radical was derived. The vibrational level population distribution is found to exhibit a strong parent molecule and environment dependence.