The ionization distribution in depth has been determined experimentally for two elements, lead and titanium, at various incident electron energies, by the sandwich tracer technique previously used by Castaing and Descamps.
The experimental curves of the ionization distribution in depth at 29 kv for lead and titanium are compared with curves calculated from the distribution in depth and energy of the incident electrons computed by Bishop. Agreement between the experimental and theoretical results is good.
The surface ionization straightphi0, which is mainly due to backscattering of the electrons, has been determined at various accelerating voltages for titanium, nickel and lead. straightphi0 is a function of the atomic number of the anticathode and of the accelerating voltage. Good agreement is obtained between the experimental values and values calculated by Duncumb and Melford. The x-ray absorption correction curves f(×) for titanium and lead have been computed from the experimental curves of the distribution in depth of the characteristic emission. These are compared with the curves predicted by the `Philibert correction'.