An expression has been derived in the light of X-ray peak-shift analysis of cubic structures by Wagner (1966), to estimate the average residual internal stresses and lattice parameter changes in hexagonal systems from measurements of relative peak-position displacements in a powder diffractometer. This has been applied to several vacuum-evaporated zinc films ( approximately 20-500 nm thick), prepared at room temperature (25 degrees C) at a residual air pressure approximately 5*10-5 Torr from a normal source. Considering the first four reflections, namely 00.2, 10.0, 10.1 and 10.2, the analysis shows that the films exhibit appreciable residual internal stresses sigma (tensile) lying in the range 1.185-0.569*109 N m-2 ( approximately 17 to 8*104 psi), which decrease gradually with increasing thickness. The thermal stresses being small, residual internal stresses appear to be mostly due to the intrinsic stresses originating from lattice imperfections in the films. The lattice parameter changes ( Delta a, Delta c) are relatively small, and close to the experimental error limits.