The seminar will be held from 2 to 4 June 1993, preceding the next meeting of the CCM, at the Laboratoire National d'Essais (LNE), 1 rue Gaston Boissier, 75015 Paris, France.
Scope of the Seminar
The purpose of the seminar is to review the state of the art of pressure measurements in the 1 kPa to 1 GPa range and to present original and innovative contributions from standards laboratories and industry.
Main Topics
The seminar will be organized in six sessions as follows:
Liquid-column manometers
Piston gauge pressure standards
Properties of liquids and gases relevant to pressure metrology
Pressure transducers and transfer standards
Pressure standard comparison (methods and results)
Dynamic pressure measurements.
Each topic will be introduced by a review paper presented by a session chairman. A final session, coordinated by Dr G F Molinar (IMGC), Chairman of the CCM High Pressure Working Group, and Dr P Stuart (NPL), Chairman of the CCM Medium Pressure Working Group, will deal with:
Call for Papers
Papers should be prepared for oral presentation and will be refereed by the session chairmen. The Proceedings will be published as a special issue of Metrologia. Papers should be written according to the instructions for authors printed on the inside back cover of this journal. A one-page abstract should be sent to
Dr Molinar at the IMGC, to arrive before 31 January 1993.
A participation fee of 900 FFr (175 US$) will be charged. This will cover general expenses and a copy of the Proceedings. Hotel reservations, meals and transport are not included.
Organizers
For further information please contact: 1993 CCM Pressure Seminar, Dr G F Molinar, Istituto di Metrologia "G Colonnetti", Strada delle Cacce 73, 1-10135 Torino, Italy
telephone (39) 11 39771; telex 212209 IMGCTO-I; fax (39) 11 346761.
Contact at the LNE: J C Legras, telephone (33) 1 40433700; fax (33) 1 40433737.
Scientific Committee
The following are responsible for the preparation of the seminar programme:
J Bonhoure, BIPM, France
V Borovkov, VNIIFTRI, Russia
C Ehrlich, NIST, USA
J Jäger, PTB, Germany
J C Legras, LNE, France
G F Molinar, IMGC, Italy
P Stuart, NPL, UK
C Tilford, NIST, USA
S Yamamoto, NRLM, Japan
R Wisniewski, Warsaw Univ. of Tech., Poland