The chemical sputtering yields of CH4/CD4 and
C2Hx/C2Dx have
been measured at the divertor plates of JT-60U. Spectroscopic
measurements for CH/CD and C2 spectral bands are applied to
estimate the CH4/CD4 and the
C2Hx/C2Dxflux. At the surface temperatures of 380, 440 and 560 K, the
CH4 yield is, respectively, ~0.8%, 1-2% and 2-3%, the
C2Hx yield 1-2%, 3-4% and 4-5%, and
the total sputtering yield by hydrogen ions 3-4%, ~8% and
~10%. With increasing ion flux to the divertor
plates (Γion), the sputtering yields (Y)
decrease, i.e. Y∝Γion(-0.05 to -0.40). With increasing electron
temperature (Te), the sputtering yields increase, i.e. Y∝Te0.5.
It is concluded from the result of regression analysis of Y∝Te0.5
that the negative dependence of the yields on the ion flux is attributed
to the incident ion energies to the carbon plates. The ratio of the
sputtering yields by deuterium ions and hydrogen ions is estimated to be
⩾1.5 based on the ion flux measurement by Hα/Dα
intensity. The C2Hx/C2Dx
sputtering yield accounts for ~80% of the total number of
sputtered carbon atoms.