Current flow past an etched barrier: field emission from a two-dimensional electron gas

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1998 EDP Sciences
, , Citation D. H. Cobden et al 1998 EPL 41 327 DOI 10.1209/epl/i1998-00151-4

0295-5075/41/3/327

Abstract

We find that, under appropriate conditions, electrons can pass a barrier etched across a two-dimensional electron gas (2DEG) by field emission from the GaAs/AlGaAs heterojunction into a second, low-density 2DEG formed deep in the substrate. The current-voltage characteristics exhibit a rapid increase in the current at the field emission threshold and intrinsic bistability above this threshold, consistent with a heating instability occurring in the second 2DEG. These results may explain similar behaviour recently seen in a number of front-gated devices by several groups.

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10.1209/epl/i1998-00151-4