Abstract
We report an experimental study of the Kondo effect in thin Cu(Mn) films. Previous experiments with Au(Fe) and Cu(Fe) films have shown that in those systems the Kondo contribution to the resistivity, ΔρK, becomes smaller as the film thickness, t, is reduced below about 2000 Å, and that it vanishes as t → 0. However, the behavior we find for Cu(Mn) is very different. In this case ΔρK varies only weakly (and perhaps not at all) with t, and approaches a nonzero value as t → 0. These results are in good agreement with recent theoretical predictions of Zawadowski and coworkers.
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