Tunneling states in tetrahedrally bonded amorphous semiconductors

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1999 EDP Sciences
, , Citation S. Dyrting et al 1999 EPL 48 403 DOI 10.1209/epl/i1999-00497-y

0295-5075/48/4/403

Abstract

Using molecular dynamics, we construct a structural model of amorphous silicon which produces well-relaxed and long-lasting structures with radial distribution functions that agree well with experimental results. The model produces a sufficient number of double-well potentials with low asymmetries, enabling a structurally-explicit microscopic portrayal of tunneling states in covalently bonded amorphous systems. A new structural characterization method is used to identify the possible origin of the tunneling states in amorphous silicon. Based on the study of the short-range order, we suggest that the tunneling states in amorphous silicon are predominantly associated with dangling bonds.

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10.1209/epl/i1999-00497-y