Abstract
Structural characterization of the third polymorph of silicon nitride, synthesized under high-pressure and high-temperature conditions, has been obtained by Rietveld structure refinements of X-ray powder diffraction data recorded using synchrotron radiation. The material has a cubic spinel structure at 295 K with a space group Fd-3m, Z = 8, a unit cell of a = 7.7339 ± 0.0001 Å, nitrogen position x = 0.2583 ± 0.0001, and density ρ = 3.75 ± 0.02 g cm−3. The complete structural data obtained should offer a firm basis for understanding the properties of the novel material. One example is present for the Raman spectroscopy data of the material.
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