Measurement of the van der Waals force using reflection of cold atoms from magnetic thin-film atom mirrors

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Published 8 February 2006 2006 EDP Sciences
, , Citation A. K. Mohapatra and C. S. Unnikrishnan 2006 EPL 73 839 DOI 10.1209/epl/i2005-10477-3

0295-5075/73/6/839

Abstract

We report on a measurement of the van der Waals interaction between rubidium atoms in the ground state and a metallic surface, employing a new method involving reflection of laser-cooled atoms from magnetic thin-film atom mirrors. We made use of the fact that the typical distance from which atoms reflect from thin-film magnetic mirrors is of the order of the magnetic domain size and the thickness of the thin film. The modification of the reflectivity of cold atoms from cobalt thin-film magnetic mirrors, with thickness in the range of 200 − 20 nm, due to the competition between the attractive atom-surface interaction and the repulsive magnetic interaction enabled the measurement of the van der Waals force in the range 20–50 nm with an uncertainty of 15%. The measured value agrees well with recent theoretical estimates.

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10.1209/epl/i2005-10477-3