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Photoionization study of Kr+ and Xe+ ions with the combined use of a merged-beam set-up and an ion trap

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Published 10 February 2011 2011 IOP Publishing Ltd
, , Citation J M Bizau et al 2011 J. Phys. B: At. Mol. Opt. Phys. 44 055205 DOI 10.1088/0953-4075/44/5/055205

0953-4075/44/5/055205

Abstract

Photoionization cross sections of halogen-like Kr+ and Xe+ ions have been measured in the photon energy range extending up to 15 eV above the threshold. Two different devices were used, a merged-beam set-up and an ion trap. Combination of the two techniques allows for the extraction of the pure ground state ionization cross section on an absolute scale. Multiconfiguration Dirac–Fock calculations reproduce the magnitude of the direct photoionization cross sections well.

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10.1088/0953-4075/44/5/055205