The PLZT 8/65/35 compound, commonly known for relaxor behaviour, as well as PLZT 8/65/35 + Me compositions
elements (Mn, Fe, Co or Cu)) is examined, a number of different techniques being used:
(1) dielectric measurements of complex permittivity
at frequencies from
to
Hz in the range of temperatures from 0 to
;
(2) Raman scattering (RS), EPR and x-ray diffraction.
The behaviour of
is interpreted assuming the existence of three different polarization mechanisms, the partial contributions to the dielectric constant of which depend on the dopant concentration and the ranges of frequencies, temperatures or field intensities. Structural criteria are proposed to evaluate the contributions from each of the mechanisms.