For the last five years, Measurement Science and Technology has awarded a Best Paper prize. The Editorial Board of the journal believes that awarding such a prize is an opportunity to say `thank you' to authors for submitting their best material, and serves as a focus for their on-going quality review. I am delighted to announce that the 1998 award is presented for the article:
D T Read (National Institute of Standards and Technology, Boulder, CO, USA) Young's modulus of thin films by speckle interferometry9 676 - 85 (published April 1998).
The award, comprising a cash honorarium and certificate, will be presented to the author at a suitable venue in the near future. In making its recommendation, the Award Committee gave the following endorsement:
`This paper used a novel mode of electronic speckle pattern interferometry to examine in-plane elastic displacements in thin film samples. Miniature samples were composed of four different types of material, such as copper film. The samples were less than 1 mm long, typically about 1.0 µm thick, and 250 µm wide. In the paper, the author began by explaining speckle interferometry and its use for displacement measurements. He described phase shifting techniques and difficulties with measurements in such small samples.
After producing speckle images by photomicroscopy, he provided a clear account of difficulties encountered when attempting to create displacement fringes by the classic ESPI technique of subtracting speckle images. Such a pattern showed faint fringes, but they were unusable for measurement, being overwhelmed by the underlying speckle. Instead, the author adopted a novel process of monitoring the behaviour of an individual intense speckle when a force is continuously increased in the sample, within the elastic limit.
The paper went on to provide a clear exposition of data reduction and experimental uncertainties before reporting on some specific values of Young's modulus in thin films. He has, therefore, developed a measurement technique to provide valuable information on the effect of texture and other microstructural features within thin films.
The Committee considered that a non-contact optical technique was well suited to this type of problem. The paper was well balanced, putting the new contribution into perspective with previous work. Good references were made to previous work, and proper consideration was given to experimental uncertainties.'
Yet again the Committee found its task particularly difficult due to the large number of high quality papers published in the journal. We therefore felt that two further papers should be individually commended:
C Lopez et al (Vigo University, Spain) Fibre optic reflectometric technique for the automatic detection and measurement of surface cracks9 1413-31 (published September 1998)
F Winquist et al (Linkoping University, Sweden) Monitoring of freshness of milk by an electronic tongue on the basis of voltammetry9 1937-46 (published December 1998).
Nominations for the 1999 Best Paper Award are currently being accepted. If, as a reader, you feel particular papers are worthy of an award please let us know. If you are an author, the Editorial Board would like to encourage you to think of Measurement Science and Technology as the home for your best submissions.
Cam Tropea Honorary Editor August 1999