The book is divided into four parts: `Systems', `System
Components', `Measurements' and `Microprocessor Based Systems'.
The first part of the book introduces Measurement Systems,
Performance Terminology, Errors, Dynamic Characteristics,
Loading Effects, Noise and Reliability.
The `Measurement Systems' subsection is not sufficiently
concise, as only a small number of derived units have been listed.
The National Physical Laboratory (NPL) has been publishing
posters that provide an excellent description of physical and
chemical quantities followed by a small abstract stating their
derivation from fundamental quantities. Such description is not
only of importance to metrologists; it also assists engineers in
seeking innovative solutions to everyday problems. A more
systematic approach along these lines would be far more
appropriate for this subsection. An introduction to dimensional
analysis would also be useful here. Dimensionless quantities and
their units or important constants have been omitted, limiting the
possible uses of the book.
With regards to the subsection describing `Measurement
Errors', I find both the NPL report on the treatment of errors
and the pocket book by N C Barford Experimental
Measurements: Precision, Error and Truth far more useful and
informative than the description found in this pocket book.
The subsection describing `Dynamic Characteristics' of
instruments is well written and concise, as would be expected
from the author's other publications, although a z-transforms
table could also be introduced in a separate section.
I found the subsection describing `Loading Effects' to be
useful in summarizing important concepts, especially the part
that describes loading of elements in a measurement system.
The subsection on `Noise' is seriously deficient, as there is
no mention of voltage and current noise associated with op-amp
circuits. Important instruments to measurement science such as
phase-sensitive detectors and box-car averagers are also not
mentioned. A more useful practical approach can be found in
the following books: P J Fish's Electronic Noise and Low Noise
Design, F R Connor's pocket book series and T H Wilmshurst's
book on Signal Recovery and Noise in Electronic Systems. In
addition, digital phase noise is not mentioned at all - a serious
omission as many systems are digital nowadays.
I was pleased to find a subsection on the `Reliability of
Instruments' as this is a topic that is not sufficiently covered in
many classic Measurement and Instrumentation textbooks, an
exception being Bentley's Principles of Measurement
Systems.
My final criticism of the first part of this pocket book is
that in the entire `Systems Section', the notion of feedback
instruments could not be found. This is a serious shortfall,
bearing in mind the distinct advantages that can be gained with
the use of feedback methods.
The second part of the book, `System Components', describes Transducers,
Signal Converters and Display Systems.
Resistive, capacitive and inductive transducers have
been covered but not to the extent found in other books, e.g.Sensors and Transducers by Usher and Keating. I found the
tabulated thermoelectric emf values with reference junction at
0 °C useful, although the descriptions of photovoltaic and
electrochemical transducers were seriously deficient.
My favorite part of the book is the section describing AC
bridges, which clearly distinguishes between the Owen,
Maxwell, Hay, De Souty, Wien and Schering configurations.
These can trigger the engineer's imagination for a variety of
measurement schemes. Unfortunately, the subsection on
frequency measurements and digital frequency counters would
require significant expansion.
The subsection on `Signal Converters' could also be
significantly expanded. For example, the three-amplifier
differential input instrumentation amplifier configuration
featuring high input impedance and adjustable gain is not
mentioned at all.
The subsection describing `Display Systems' may be
considered obsolete and of limited use to current practising
engineers, as most systems nowadays interface directly with
microprocessors.
The third part of the book, `Measurements', covers Chemical
Composition, Density, Displacement, Electrical Quantities,
Flow, Force, Level, Pressure, Radiation, Stress and Strain,
Temperature and Vacuum Sensors.
The `Chemical Composition' subsection is too much of an
overview to be of any use to a practising engineer. I found the
general diagrams of atomic emission/absorption spectrometry,
fluorimetry and mass spectrometry lacking in detail, and of no
practical use whatsoever.
In contrast, the section on `Electrical Quantities' was
sufficiently detailed. The subsection on `Density' is useful,
but that describing `Displacement' can even
be misleading. For example, a heterodyne interferometer is
described whereas homodyne or superheterodyne systems are
not mentioned at all. A description of optical fibre `point',
`distributed' or `quasi-distributed' sensors should have also been
included in this subsection. Fast-pulse systems are also
commonly used in measurement science with applications in
chemistry, physics and biology. Their general principle of
operation should also have been included.
In addition, a disproportionate amount of detail (8% of the
entire book) has been dedicated to the description of the
Measurement of Flow, whereas only five pages are devoted to the
Force and Radiation topics. This is not justifiable if the author's
goal is to give a balanced account of the techniques used in
instrumentation and measurement science.
Finally, in part four, `Microprocessor Based Systems' are
described. There are two subsections describing `Intelligent
Instruments' and `Interfacing'. The former
is an overview of Microprocessor Systems,
Microcontrollers, Data Acquisition Systems and Data Logging.
The `Interfacing' subsection briefly describes a Standard Bus,
Centronics and Serial Ports, the I2C Bus, as well as Interfacing
Peripherals and Programmable Interfaces.
Here again, my criticism is that feedback instruments
where the analogue loop has been replaced by a digital one
have not been analysed in detail. Most PID controllers nowadays
can easily be implemented in a digital form using
microprocessor systems, eliminating possible drifts of analogue
components. In addition, oversampling methods for A/D and
D/A conversion are not described in sufficient detail; see for
example the books Oversampling Delta-Sigma Data
Converters edited by Candy and Temes and Advanced
Instrumentation and Computer I/O Design by Garrett (both by
IEEE Press). I have found the PC-Based Instrumentation and
Control by Tooley and The Art of Digital Audio by
Watkinson far more useful for practical applications. A
paragraph on sensor fusion and a mention of the latest advances
in commercially available digital sampling oscilloscopes such as
the Agilent Technology `Infiniium' family or the Tektronix 8000
Series, which should be soon compatible with LABVIEW
software, would have also been useful.
Overall, I found this pocket book of limited practical use,
even to first-year undergraduate students or technicians at the
start of their careers, when selecting components from RS or
Farnell catalogues for small projects.
Although many measurement techniques are based on the
interaction of light with matter, electromagnetism and microwave
techniques are not covered in this pocket book. Furthermore,
astrophysical techniques, or techniques used in particle physics,
instrumentation for biology, plasma physics and nuclear
science are not mentioned at all.
Currently, there is a plethora of practical books on analogue
electronics that a practising engineer or technician may
consult, such as Horowitz and Hill's Art of Electronics,
the book A Practical Introduction to Electronic Circuits
by M H Jones or the series of pocket books by R M Marston, which
will provide solutions to most practical problems.
More detailed engineering solutions can be found in most
Application Notes published by semiconductor companies such
as Analog Devices, National Semiconductors etc, or
instrumentation companies such as Hewlett-Packard,
Anritsu-Wiltron and Tektronix at the component or system level
respectively. These are far more comprehensive and useful to
engineers and practising technicians.
A pocket book on `Instrumentation & Measurement'
should be a distillation of existing measurement techniques
described in a concise and practical way. My concern is that this
pocket book tries to cover too many topics in a very short space.
Although not pocket books, the Concise Encyclopedia of
Measurement & Instrumentation edited by Finkelstein and
Grattan (Pergamon Press), the Electrical Engineering
Handbook edited by Dorf (CRC Press), the Electronic
Instrument Handbook edited by Coombs, and Doebelin's Measurement Systems are excellent examples of complete and
useful reference books available at the moment.
Sillas Hadjiloucas