This issue of Measurement Science and Technology (MST) contains three papers presented at the second international symposium on Standard Materials and Metrology for Nanotechnology (SMAM-2), held in the Akihabara Convention Hall in Tokyo, Japan, on 25 and 26 May 2006.
The SMAM symposium aims to emphasize the importance of standard materials and metrology (SM/M) for the development of nanotechnology, which is expected to be the most promising driving force for the development of advanced industrial science/technology in various fields. New fabrication processes based on nanotechnology will become really powerful when the processes are reproducible and reliable. The SM/M that have been developed for use in nano-scale characterization are therefore the key tools for the establishment of reliability in the areas of information, environment and biotechnology, where the application of nanotechnology is essential for their development.
The symposium had four sessions featuring the most important issues in the field of SM/M: (I) Nanotechnology Standardization, (II) SM/M for Nano-particles and Nano-pores, (III) SM/M for Nanostructure Evaluation, (IV) SM/M for Thin-film Characterization. A total of 29 papers had been submitted to the SMAM-2 Publishing Committee and six papers were tentatively selected by the committee to forward to the MST editors for publication in this journal. The three papers published in this issue are epoch-making in that they present new methods and knowledge for the standard materials and metrology especially developed for nanotechnology. We hope the papers will show readers how important standard materials and metrology are for the development of nanotechnology.
We appreciate very much the important contribution of those who refereed the manuscripts and we particularly want to thank the MST staff for helping in publishing this special feature. Finally we expect SMAM-3 to be held two years after SMAM-2 and we hope to attract many more participants and papers and to publish a further special feature in MST.
Shingo Ichimura
Chairman of the Organizing Committee of SMAM-2