Since defect rates are expected to be high in nanocircuitry, we analyse the performance of
resistor-based demultiplexers in the presence of defects. The defects observed to occur in
fabricated nanoscale crossbars are stuck-open, stuck-closed, stuck-short, broken-wire,
and adjacent-wire-short defects. We analyse the distribution of voltages on the
nanowire output lines of a resistor-logic demultiplexer, based on an arbitrary
constant-weight code, when defects occur. These analyses show that resistor-logic
demultiplexers can tolerate small numbers of stuck-closed, stuck-open, and broken-wire
defects on individual nanowires, at the cost of some degradation in the circuit's
worst-case voltage margin. For stuck-short and adjacent-wire-short defects, and for
nanowires with too many defects of the other types, the demultiplexer can still achieve
error-free performance, but with a smaller set of output lines. This design thus
has two layers of defect tolerance: the coding layer improves the yield of usable
output lines, and an avoidance layer guarantees that error-free performance is
achieved.