The optical detection of ultrasound from optically rough surfaces is severely limited when using a conventional interferometric or optical beam deflection (OBD) setup because the detected light is speckled. This means that complicated and expensive setups are required to detect ultrasound optically on rough surfaces. We present a CMOS integrated circuit that can detect laser ultrasound in the presence of speckle. The detector circuit is based on the simple knife edge detector. It is self-adapting and is fast, inxepensive, compact and robust.

The CMOS circuit is implemented as a widefield array of 32×32 pixels. At each pixel the received light is compared with an adjacent pixel in order to determine the local light gradient. The result of this comparison is stored and used to connect each pixel to the positive or negative gradient output as appropriate (similar to a balanced knife edge detector). The perturbation of the surface due to ultrasound preserves the speckle distribution whilst deflecting it. The spatial disturbance of the speckle pattern due to the ultrasound is detected by considering each pair of pixels as a knife edge detector. The sensor can adapt itself to match the received optical speckle pattern in less than 0.1 μs, and then detect the ultrasound within 0.5 μs of adaptation. This makes it possible to repeatedly detect ultrasound from optically rough surfaces very quickly. The detector is capable of independent operation controlled by a local microcontroller, or it may be connected to a computer for more sophisticated configuration and control.

We present the theory of its operation and discuss results validating the concept and operation of the device. We also present preliminary results from an improved design which grants a higher bandwidth, allowing for optical detection of higher frequency ultrasound.