Fine-pitch glass GEM for high-resolution X-ray imaging

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Published 19 December 2016 © 2016 IOP Publishing Ltd and Sissa Medialab srl
, , 18th International Workshop on Radiation Imaging Detectors (IWORID2016) Citation T. Fujiwara et al 2016 JINST 11 C12050 DOI 10.1088/1748-0221/11/12/C12050

1748-0221/11/12/C12050

Abstract

We have developed a fine-pitch glass gas electron multiplier (G-GEM) for high-resolution X-ray imaging. The fine-pitch G-GEM is made of a 400 μm thick photo-etchable glass substrate with 150 μm pitch holes. It is fabricated using the same wet etching technique as that for the standard G-GEM. In this work, we present the experimental results obtained with a single fine-pitch G-GEM with a 50 × 50 mm2 effective area. We recorded an energy resolution of 16.2% and gas gain up to 5,500 when the detector was irradiated with 5.9 keV X-rays. We present a 50 × 50 mm2 X-ray radiograph image acquired with a scintillation gas and optical readout system.

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10.1088/1748-0221/11/12/C12050