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AFM tip characterization by Kelvin probe force microscopy
C Barth1, T Hynninen3,4, M Bieletzki2, C R Henry1, A S Foster3,4, F Esch2 and U Heiz2
Published 15 September 2010 •
Published under licence by IOP Publishing Ltd
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Citation C Barth et al 2010 New J. Phys. 12 093024
DOI 10.1088/1367-2630/12/9/093024
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