TOPICAL REVIEW

Sidewall GaAs tunnel junctions fabricated using molecular layer epitaxy

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Published 2 February 2012 2012 National Institute for Materials Science
, , Citation Takeo Ohno and Yutaka Oyama 2012 Sci. Technol. Adv. Mater. 13 013002 DOI 10.1088/1468-6996/13/1/013002

1468-6996/13/1/013002

Abstract

In this article we review the fundamental properties and applications of sidewall GaAs tunnel junctions. Heavily impurity-doped GaAs epitaxial layers were prepared using molecular layer epitaxy (MLE), in which intermittent injections of precursors in ultrahigh vacuum were applied, and sidewall tunnel junctions were fabricated using a combination of device mesa wet etching of the GaAs MLE layer and low-temperature area-selective regrowth. The fabricated tunnel junctions on the GaAs sidewall with normal mesa orientation showed a record peak current density of 35 000 A cm-2. They can potentially be used as terahertz devices such as a tunnel injection transit time effect diode or an ideal static induction transistor.

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10.1088/1468-6996/13/1/013002