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Effect of Cu impurities on wet etching of Si(110): formation of trapezoidal hillocks

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Published 25 January 2008 Published under licence by IOP Publishing Ltd
, , Citation Teemu Hynninen et al 2008 New J. Phys. 10 013033 DOI 10.1088/1367-2630/10/1/013033

1367-2630/10/1/013033

Abstract

We simulate the formation of experimentally observed trapezoidal hillocks on etched Si(110) surfaces, describing their generic geometrical shape and analyzing the relative stability and/or reactivity of the key surface sites. In our model, the hillocks are stabilized by Cu impurities in the etchant adsorbing on the surface and acting as pinning agents. A model of random adsorptions will not result in hillock formation since a single impurity is easily removed from the surface. Instead a whole cluster of Cu atoms is needed as a mask to stabilize a hillock. Therefore we propose and analyze mechanisms that drive correlated adsorptions and lead to stable Cu clusters.

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10.1088/1367-2630/10/1/013033